Angebote zu "Calibration" (13 Treffer)

Kategorien

Shops

Shoaib:The Calibration of 2-Port Vector
43,19 € *
ggf. zzgl. Versand

Erscheinungsdatum: 03/2012, Medium: Taschenbuch, Einband: Kartoniert / Broschiert, Titel: The Calibration of 2-Port Vector Network Analyzer (VNA), Titelzusatz: A Comparative Study, Autor: Shoaib, Nosherwan, Verlag: LAP Lambert Academic Publishing, Sprache: Englisch, Rubrik: Elektronik // Elektrotechnik, Nachrichtentechnik, Seiten: 72, Informationen: Paperback, Gewicht: 127 gr, Verkäufer: averdo

Anbieter: averdo
Stand: 07.04.2020
Zum Angebot
The Calibration of 2-Port Vector Network Analyz...
48,99 € *
ggf. zzgl. Versand

The Calibration of 2-Port Vector Network Analyzer (VNA) ab 48.99 € als Taschenbuch: A Comparative Study. Aus dem Bereich: Bücher, Wissenschaft, Technik,

Anbieter: hugendubel
Stand: 07.04.2020
Zum Angebot
The Calibration of 2-Port Vector Network Analyz...
49,00 € *
ggf. zzgl. Versand

The calibration of Vector Network Analyzer (VNA) is carried out to compute the error coefficients and to correct the raw data. Several Calibration algorithms are used to calibrate 2-port VNA. Some of the well known calibration procedures are Thru-Short-Delay (TSD) and Thru-Reflect-Line (TRL), Short-Open-Load-Reciprocal (SOLR) and Line-Reflect-Match (LRM). In this book, all the state-of-art calibration techniques have been thoroughly studied. Some of the well known calibration procedures are mathematically analyzed and implemented. Several on wafer devices are measured and their data is corrected by different calibration algorithms mentioned above. Then all the experimental results of different calibration techniques are compared and commented. The advantages and disadvantages of different calibration algorithms are also discussed.

Anbieter: Dodax
Stand: 07.04.2020
Zum Angebot
Vector Network Analyzer (VNA) Measurements and ...
112,98 € *
ggf. zzgl. Versand

This book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.

Anbieter: Dodax
Stand: 07.04.2020
Zum Angebot
Handbook of Microwave Component Measurements
183,00 CHF *
ggf. zzgl. Versand

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: * Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure * Offers a detailed explanation of algorithms and mathematics behind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader * Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

Anbieter: Orell Fuessli CH
Stand: 07.04.2020
Zum Angebot
The Calibration of 2-Port Vector Network Analyz...
79,90 CHF *
ggf. zzgl. Versand

The calibration of Vector Network Analyzer (VNA) is carried out to compute the error coefficients and to correct the raw data. Several Calibration algorithms are used to calibrate 2-port VNA. Some of the well known calibration procedures are Thru-Short-Delay (TSD) and Thru-Reflect-Line (TRL), Short-Open-Load-Reciprocal (SOLR) and Line-Reflect-Match (LRM). In this book, all the state-of-art calibration techniques have been thoroughly studied. Some of the well known calibration procedures are mathematically analyzed and implemented. Several on wafer devices are measured and their data is corrected by different calibration algorithms mentioned above. Then all the experimental results of different calibration techniques are compared and commented. The advantages and disadvantages of different calibration algorithms are also discussed.

Anbieter: Orell Fuessli CH
Stand: 07.04.2020
Zum Angebot
Handbook of Microwave Component Measurements
105,00 CHF *
ggf. zzgl. Versand

This book provides state-of-the-art coverage for makingmeasurements on RF and Microwave Components, both active andpassive. A perfect reference for R&D and Test Engineers, withtopics ranging from the best practices for basic measurements, toan in-depth analysis of errors, correction methods, and uncertaintyanalysis, this book provides everything you need to understandmicrowave measurements. With primary focus on active and passivemeasurements using a Vector Network Analyzer, these techniques andanalysis are equally applicable to measurements made with SpectrumAnalyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurementscomplete with extensive definitions and descriptions of componentcharacteristics and measurement parameters. The latterchapters give detailed examples for cases of cable, connector andfilter measurements; low noise, high-gain and high power amplifiermeasurements, a wide range of mixer and frequency convertermeasurements, and a full examination of fixturing, de-embedding,balanced measurements and calibration techniques. The chapter ontime-domain theory and measurements is the most complete treatmenton the subject yet presented, with details of the underlyingmathematics and new material on time domain gating. As the inventorof many of the methods presented, and with 30 years as adevelopment engineer on the most modern measurement platforms, theauthor presents unique insights into the understanding of modernmeasurement theory. Key Features: * Explains the interactions between the device-under-test (DUT)and the measuring equipment by demonstrating the best practices forascertaining the true nature of the DUT, and optimizing the time toset up and measure * Offers a detailed explanation of algorithms and mathematicsbehind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams forcircuit connections and measurement setups) and practical exampleson real-world devices, which can provide immediate benefit to thereader * Written by the principle developer and designer of many of themeasurement methods described This book will be an invaluable guide for RF and microwaveR&D and test engineers, satellite test engineers, radarengineers, power amplifier designers, LNA designers, and mixerdesigners. University researchers and graduate students inmicrowave design and test will also find this book of interest.

Anbieter: Orell Fuessli CH
Stand: 07.04.2020
Zum Angebot
Handbook of Microwave Component Measurements
105,00 CHF *
ggf. zzgl. Versand

This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure Offers a detailed explanation of algorithms and mathematics behind measurements and error correction Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest.

Anbieter: Orell Fuessli CH
Stand: 07.04.2020
Zum Angebot
The Calibration of 2-Port Vector Network Analyz...
43,99 € *
ggf. zzgl. Versand

The calibration of Vector Network Analyzer (VNA) is carried out to compute the error coefficients and to correct the raw data. Several Calibration algorithms are used to calibrate 2-port VNA. Some of the well known calibration procedures are Thru-Short-Delay (TSD) and Thru-Reflect-Line (TRL), Short-Open-Load-Reciprocal (SOLR) and Line-Reflect-Match (LRM). In this book, all the state-of-art calibration techniques have been thoroughly studied. Some of the well known calibration procedures are mathematically analyzed and implemented. Several on wafer devices are measured and their data is corrected by different calibration algorithms mentioned above. Then all the experimental results of different calibration techniques are compared and commented. The advantages and disadvantages of different calibration algorithms are also discussed.

Anbieter: Thalia AT
Stand: 07.04.2020
Zum Angebot